DocumentCode
873437
Title
Intermittent failure problems of four-phase MOS circuits
Volume
4
Issue
3
fYear
1969
fDate
6/1/1969 12:00:00 AM
Firstpage
107
Lastpage
110
Abstract
A single four-phase MOS logic gate is capable of implementing a fairly complex Boolean function in a simple fashion. It is seen that a complex four-phase MOS gate exhibits certain circuit noise problems and peculiar transient behavior not observed in a simple four-phase MOS gate. The result of this noise can cause intermittent failures of the circuits. Solutions to the problems are discussed in this paper.
Keywords
Failure analysis; Logic circuits; failure analysis; logic circuits; Boolean functions; Capacitance; Circuit noise; Circuit testing; Clocks; Logic circuits; Logic gates; MOSFETs; Switching circuits; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1969.1049972
Filename
1049972
Link To Document