Title :
Intermittent failure problems of four-phase MOS circuits
fDate :
6/1/1969 12:00:00 AM
Abstract :
A single four-phase MOS logic gate is capable of implementing a fairly complex Boolean function in a simple fashion. It is seen that a complex four-phase MOS gate exhibits certain circuit noise problems and peculiar transient behavior not observed in a simple four-phase MOS gate. The result of this noise can cause intermittent failures of the circuits. Solutions to the problems are discussed in this paper.
Keywords :
Failure analysis; Logic circuits; failure analysis; logic circuits; Boolean functions; Capacitance; Circuit noise; Circuit testing; Clocks; Logic circuits; Logic gates; MOSFETs; Switching circuits; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1969.1049972
