• DocumentCode
    873734
  • Title

    Electromagnetic wave scattering from very rough surfaces composed of correlated large and small scale roughness

  • Author

    Kaufman, D.E. ; Hayre, H.S.

  • Volume
    53
  • Issue
    8
  • fYear
    1965
  • Firstpage
    1157
  • Lastpage
    1158
  • Keywords
    Capacitance; Electromagnetic scattering; Error analysis; FETs; Physics; Rough surfaces; Space charge; Surface roughness; Surface waves; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1965.4141
  • Filename
    1446071