Title :
Circuit models for constant impedance micromachined lines on dielectric transitions
Author :
Banerjee, S. Riki ; Drayton, Rhonda Franklin
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
Abstract :
Constant impedance microstrip lines printed across nonuniform thickness substrates are studied. Accurate LC models are described to predict the discontinuity effect for dielectric step changes greater than 200 μm at the boundary interface. A variety of step or taper transition combinations in the conductor and dielectric are considered. When compared to full-wave simulations, the successfully modeled designs have return and insertion losses within 3 and 0.33 dB, respectively.
Keywords :
dielectric losses; finite element analysis; micromechanical devices; microstrip discontinuities; microstrip transitions; FEM field solver; LC models; bandwidth performance; boundary interface; circuit models; constant impedance micromachined lines; dielectric step changes; dielectric transitions; discontinuity effect; insertion losses; interconnect behavior; microstrip lines; nonuniform thickness substrates; return losses; step transition; taper transition; Conductors; Dielectric substrates; Impedance; Integrated circuit interconnections; Integrated circuit technology; Micromachining; Microstrip; Radio frequency; Semiconductor device modeling; Silicon;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2003.921253
