• DocumentCode
    873898
  • Title

    Sample-tip interaction of piezoresponse force microscopy in ferroelectric nanostructures

  • Author

    Peter, Frank ; Rüdiger, Andreas ; Szot, Krzysztof ; Waser, Rainer ; Reichenberg, Bernd

  • Author_Institution
    Inst. fur Festkorperforschung, Forschungszentrum Julich
  • Volume
    53
  • Issue
    12
  • fYear
    2006
  • fDate
    12/1/2006 12:00:00 AM
  • Firstpage
    2253
  • Lastpage
    2260
  • Abstract
    We report on qualitative and quantitative implications of the sample-tip interaction in piezoresponse force microscopy. Our finite-element analysis of adsorbate effects, sample heterogeneities, and tip asymmetries is in agreement with experimental observation of ferroelectric nanostructures. Qualitative discrepancies arise from locally asymmetric tip-sample interaction. Any quantitative determination of field-related material parameters as required for the verification of semiempirical models of the ferroelectric limit typically relies on an overestimated field across the sample. Our findings indicate that adsorbates reduce the actual field across the nanograin by roughly one order of magnitude
  • Keywords
    adsorbed layers; atomic force microscopy; ferroelectric materials; finite element analysis; nanostructured materials; piezoelectricity; adsorbate effects; ferroelectric limit; ferroelectric nanostructures; field-related material parameters; finite-element analysis; nanograin; piezoresponse force microscopy; Atomic force microscopy; Ferroelectric materials; Finite element methods; Force measurement; Nanostructures; Optical noise; Optical variables control; Photodiodes; Ultrasonic variables measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2006.170
  • Filename
    4037258