Title :
Long-term operation and performance of cryogenic sapphire oscillators
Author :
Tobar, Michael E. ; Ivanov, Eugene N. ; Locke, Clayton R. ; Stanwix, Paul L. ; Hartnett, John G. ; Luiten, Andre N. ; Warrington, Richard B. ; Fisk, Peter T H ; Lawn, Malcolm A. ; Wouters, Michael J. ; Bize, Sebastien ; Santarelli, Giorgio ; Wolf, Peter ;
Author_Institution :
Sch. of Phys., Western Australia Univ., Crawley, WA
fDate :
12/1/2006 12:00:00 AM
Abstract :
Cryogenic sapphire oscillators (CSO) developed at the University of Western Australia (UWA) have now been in operation around the world continuously for many years. Such oscillators, due to their excellent spectral purity are essential for interrogating atomic frequency standards at the limit of quantum projection noise; otherwise aliasing effects will dominate the frequency stability due to the periodic sampling between successive interrogations of the atomic transition. Other applications, which have attracted attention in recent years, include tests on fundamental principles of physics, such as tests of Lorentz invariance. This paper reports on the long-term operation and performance of such oscillators. We compare the long-term drift of some different CSOs. The drift rates turn out to be linear over many years and in the same direction. However, the magnitude seems to vary by more than one order of magnitude between the oscillators, ranging from 1014 per day to a few parts in 1013 per day
Keywords :
atomic clocks; cryogenic electronics; frequency standards; oscillators; sapphire; Lorentz invariance; University of Western Australia; aliasing effects; atomic frequency standards; atomic transition interrogation; cryogenic sapphire oscillator; frequency stability; long-term drift; periodic sampling; quantum projection noise; spectral purity; Atomic clocks; Australia; Cryogenics; Dielectric measurements; Frequency; Microwave oscillators; Physics; Stability; Superconducting microwave devices; Testing;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2006.187