DocumentCode
874156
Title
Measuring the intrinsic-base-region currents of a transistor
Author
Boothroyd, A.R.
Volume
3
Issue
10
fYear
1967
fDate
10/1/1967 12:00:00 AM
Firstpage
456
Lastpage
457
Abstract
An experimental method of cancelling depletion-layer capacitance-current flow to permit exact observations of the current flow into the transistor `intrinsic base region¿ is described.
Keywords
electric current measurement; transistors;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19670361
Filename
4207416
Link To Document