Title :
Report on the Minisession "New Developments in Flash ADC Integrated Circuits"
Author :
Dhawan, Satish K.
Author_Institution :
Yale University, New Haven CT 06511
Keywords :
Analog integrated circuits; Analog-digital conversion; Clocks; Collision mitigation; Consumer electronics; DH-HEMTs; Digital integrated circuits; Manufacturing; Physics; Sampling methods;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333375