• DocumentCode
    874285
  • Title

    Fast optimization, tolerance analysis, and yield estimation of H-/E-plane waveguide components with irregular shapes

  • Author

    Arcioni, Paolo ; Bozzi, Maurizio ; Bressan, Marco ; Conciauro, Giuseppe ; Perregrini, Luca

  • Author_Institution
    Dept. of Electron., Pavia Univ., Italy
  • Volume
    52
  • Issue
    1
  • fYear
    2004
  • Firstpage
    319
  • Lastpage
    328
  • Abstract
    This paper presents an algorithm for the wide-band optimization of H- and E-plane waveguide components with irregular shapes. The algorithm is based on the boundary-integral-resonant-mode expansion method, used in conjunction with a variational technique, which permits the determination of the objective function and of its gradient by solving a single electromagnetic problem. The same technique allows for performing a sensitivity analysis to check the effect of the mechanical tolerances on the performance of the component and to estimate the yield for a given manufacturing technology on a large-scale production. Many examples demonstrate the effectiveness of the proposed algorithm.
  • Keywords
    CAD; Rayleigh-Ritz methods; S-parameters; boundary integral equations; computational electromagnetics; eigenvalues and eigenfunctions; electric admittance; frequency response; gradient methods; optimisation; perturbation techniques; poles and zeros; sensitivity analysis; tolerance analysis; waveguide components; E-plane waveguide components; H-plane waveguide components; Rayleigh-Ritz method; admittance matrix; boundary-integral-resonant-mode expansion; efficient computer-aided design; fast electromagnetic solvers; fast wideband optimization; gradient-based algorithm; irregular shapes; large-scale production; mechanical tolerances; objective function gradient; perturbation method; poles; scattering parameters; sensitivity analysis; single electromagnetic problem; tolerance analysis; variational technique; yield estimation; Electromagnetic waveguides; Large-scale systems; Manufacturing; Production; Sensitivity analysis; Shape; Tolerance analysis; Waveguide components; Wideband; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2003.820888
  • Filename
    1262725