DocumentCode
874301
Title
On the 1/f frequency noise in ultra-stable quartz oscillators
Author
Rubiola, Enrico ; Giordano, Vincent
Author_Institution
FEMTO-ST Inst., Univ. de Franche-Comte, Besancon
Volume
54
Issue
1
fYear
2007
fDate
1/1/2007 12:00:00 AM
Firstpage
15
Lastpage
22
Abstract
The frequency flicker of an oscillator, which appears as a 1/f3 line in the phase noise spectral density, and as a floor on the Allan deviation plot, originates from two basic phenomena, namely, (1) the 1/f phase noise turned into 1/f frequency noise via the Leeson effect, and (2) the 1/f fluctuation of the resonator natural frequency. The discussion on which is the dominant effect, thus on how to improve the stability of the oscillator, has been going on for years without giving a clear answer. This article tackles the question by analyzing the phase noise spectrum of several commercial oscillators and laboratory prototypes, and demonstrates that the fluctuation of the resonator natural frequency is the dominant effect. The investigation method starts from reverse engineering the oscillator phase noise in order to show that if the Leeson effect was dominant, the resonator merit factor Q would be too low as compared to the available technology.
Keywords
1/f noise; crystal resonators; flicker noise; fluctuations; oscillators; phase noise; 1/f fluctuation; 1/f frequency noise; 1/f phase noise; Leeson effect; frequency flicker; resonator merit factor; resonator natural frequency; ultra-stable quartz oscillators; 1f noise; Fluctuations; Frequency conversion; Laboratories; Oscillators; Phase noise; Prototypes; Resonant frequency; Space technology; Stability; Computer Simulation; Electronics; Equipment Design; Equipment Failure Analysis; Models, Statistical; Models, Theoretical; Oscillometry; Quartz; Stochastic Processes;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2007.207
Filename
4037296
Link To Document