• DocumentCode
    874301
  • Title

    On the 1/f frequency noise in ultra-stable quartz oscillators

  • Author

    Rubiola, Enrico ; Giordano, Vincent

  • Author_Institution
    FEMTO-ST Inst., Univ. de Franche-Comte, Besancon
  • Volume
    54
  • Issue
    1
  • fYear
    2007
  • fDate
    1/1/2007 12:00:00 AM
  • Firstpage
    15
  • Lastpage
    22
  • Abstract
    The frequency flicker of an oscillator, which appears as a 1/f3 line in the phase noise spectral density, and as a floor on the Allan deviation plot, originates from two basic phenomena, namely, (1) the 1/f phase noise turned into 1/f frequency noise via the Leeson effect, and (2) the 1/f fluctuation of the resonator natural frequency. The discussion on which is the dominant effect, thus on how to improve the stability of the oscillator, has been going on for years without giving a clear answer. This article tackles the question by analyzing the phase noise spectrum of several commercial oscillators and laboratory prototypes, and demonstrates that the fluctuation of the resonator natural frequency is the dominant effect. The investigation method starts from reverse engineering the oscillator phase noise in order to show that if the Leeson effect was dominant, the resonator merit factor Q would be too low as compared to the available technology.
  • Keywords
    1/f noise; crystal resonators; flicker noise; fluctuations; oscillators; phase noise; 1/f fluctuation; 1/f frequency noise; 1/f phase noise; Leeson effect; frequency flicker; resonator merit factor; resonator natural frequency; ultra-stable quartz oscillators; 1f noise; Fluctuations; Frequency conversion; Laboratories; Oscillators; Phase noise; Prototypes; Resonant frequency; Space technology; Stability; Computer Simulation; Electronics; Equipment Design; Equipment Failure Analysis; Models, Statistical; Models, Theoretical; Oscillometry; Quartz; Stochastic Processes;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2007.207
  • Filename
    4037296