Title :
A fast and accurate method of measuring two-port parameters up to 200 MHz
Author :
Fischer, Wolf-Joachim
Abstract :
Design and performance of a test jig is described, which permits the measurement of any set of four complex transistor Y parameters in less than one minute. It is particularly convenient that continuous readings can be taken during bias, frequency, or temperature variations. The vector voltmeter indicates approximate results directly in amplitude and phase. Accurate results must be calculated from the readings.
Keywords :
Transistors; transistors; Boron; Brightness; Chromium; Electron emission; Light emitting diodes; Light sources; Luminescence; P-n junctions; Reproducibility of results; Silicon carbide;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1969.1050049
