Production of a "Standard" Radiation Environment to Minimize Dosimetry Errors in Flash X-Ray Parts Testing

Calculations have been performed to indicate the effects of differing device caps and of spectrum filtration on dosimetry errors in flash x-ray parts testing. Dosimetry typically used for upset or latch-up testing of microelectronic devices with flash x-ray sources can be in error by 300% or more due to interface dose enhancement effects. When the use of spectrum hardening is permissible, placing the device to be irradiated within a Pb/Ta box can reduce the dosimetry errors to less than 20% in most cases. Obtaining the interface dose enhancement factor by using the experimentally obtained ratio of effects on devices behind Kovar/Au caps to effects measured using alumina caps is shown to give erroneous results.