PYFS-a statistical optimization method for integrated circuit yield enhancement

Author

Pan, ShaoWei ; Hu, Yu Hen

Author_Institution

Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA

Volume

12

Issue

2

fYear

1993

fDate

2/1/1993 12:00:00 AM

Firstpage

296

Lastpage

309

Abstract

An efficient optimization method for the statistical design of integrated circuits is presented. This method, called the pseudo yield function substitution (PYFS) algorithm, is developed to help a designer select design parameters to maximize the product yield. The design goal of PYFS is to use fewer simulation runs to reach a yield-optimized design. This is accomplished with the development of an improved response surface method for accurate estimation of the circuit response function, and the use of a novel PYFS method for yield maximization

Keywords

circuit CAD; integrated circuit technology; optimisation; statistical analysis; PYFS algorithm; integrated circuit yield enhancement; pseudo yield function substitution; statistical design; statistical optimization method; yield maximization; Algorithm design and analysis; Circuit simulation; Circuit synthesis; Design methodology; Integrated circuit yield; Manufacturing; Optimization methods; Response surface methodology; Search methods; Yield estimation;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.205009

Filename

205009