• DocumentCode
    875073
  • Title

    Charge Collection in Multilayer Structures

  • Author

    Knudson, A.R. ; Campbell, A.B. ; Shapiro, P. ; Stapor, W.J. ; Wolicki, E.A. ; Petersen, E.L. ; Diehl-Nagle, S.E. ; Hauser, J. ; Dressendorfer, P.V.

  • Author_Institution
    Naval Research Laboratory Washington, D. C. 20375
  • Volume
    31
  • Issue
    6
  • fYear
    1984
  • Firstpage
    1149
  • Lastpage
    1154
  • Abstract
    Charge collection measurements using energetic ions have been performed on layered structures in bulk and epitaxial silicon. Both fast transient digitizer and slower charge sensitive preamplifier measurements have been made as a function of bias, ion type, energy, and angle of incidence. The existence of pulses of both polarities on a node after passage of a charged particle has been seen in certain Cases.
  • Keywords
    Charge measurement; Current measurement; Energy measurement; Integrated circuit measurements; Laboratories; Nonhomogeneous media; Pulse measurements; Single event transient; Time measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1984.4333473
  • Filename
    4333473
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=875073