DocumentCode
875141
Title
A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984
Author
Nichols, Donald K. ; Price, William E. ; Malone, Carl J. ; Smith, Lawrence S.
Author_Institution
Jet Propulsion Laboratory California Institute of Technology 4800 Oak Grove Drive Pasadena, California 91109
Volume
31
Issue
6
fYear
1984
Firstpage
1186
Lastpage
1189
Abstract
A summary of eleven JPL tests for single event upset (SEU) performed at various accelerators, from May 1982 through January 1984, is presented. This data may be regarded as an update or follow-on to the large compilation of JPL data taken through May 1982, published in the 1983 IEEE issue of this conference. For brevity, most of the data is given for the most ionizing beam used, only. Whenever available, both cross section and LET threshold is tabulated.
Keywords
Cyclotrons; Ion accelerators; Life estimation; Linear particle accelerator; PROM; Particle beams; Protons; Single event upset; Space technology; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1984.4333480
Filename
4333480
Link To Document