• DocumentCode
    875141
  • Title

    A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984

  • Author

    Nichols, Donald K. ; Price, William E. ; Malone, Carl J. ; Smith, Lawrence S.

  • Author_Institution
    Jet Propulsion Laboratory California Institute of Technology 4800 Oak Grove Drive Pasadena, California 91109
  • Volume
    31
  • Issue
    6
  • fYear
    1984
  • Firstpage
    1186
  • Lastpage
    1189
  • Abstract
    A summary of eleven JPL tests for single event upset (SEU) performed at various accelerators, from May 1982 through January 1984, is presented. This data may be regarded as an update or follow-on to the large compilation of JPL data taken through May 1982, published in the 1983 IEEE issue of this conference. For brevity, most of the data is given for the most ionizing beam used, only. Whenever available, both cross section and LET threshold is tabulated.
  • Keywords
    Cyclotrons; Ion accelerators; Life estimation; Linear particle accelerator; PROM; Particle beams; Protons; Single event upset; Space technology; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1984.4333480
  • Filename
    4333480