Title :
Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data
Author :
Koga, R. ; Kolasinski, W.A.
Author_Institution :
Space Sciences Laboratory, The Aerospace Corporation P. O. Box 92957, Los Angeles, CA 90009
Abstract :
A summary of heavy ion SEU and latch-up data collected within the last several years is presented in this report. The devices tested range from simple logic circuits to microprocessors including examples of bipolar, CMOS, and NMOS technologies.
Keywords :
Aerospace engineering; Aerospace testing; CMOS technology; Circuit testing; Laboratories; Life estimation; Logic testing; Microprocessors; Particle beams; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333481
