• DocumentCode
    875150
  • Title

    Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data

  • Author

    Koga, R. ; Kolasinski, W.A.

  • Author_Institution
    Space Sciences Laboratory, The Aerospace Corporation P. O. Box 92957, Los Angeles, CA 90009
  • Volume
    31
  • Issue
    6
  • fYear
    1984
  • Firstpage
    1190
  • Lastpage
    1195
  • Abstract
    A summary of heavy ion SEU and latch-up data collected within the last several years is presented in this report. The devices tested range from simple logic circuits to microprocessors including examples of bipolar, CMOS, and NMOS technologies.
  • Keywords
    Aerospace engineering; Aerospace testing; CMOS technology; Circuit testing; Laboratories; Life estimation; Logic testing; Microprocessors; Particle beams; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1984.4333481
  • Filename
    4333481
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=875150