DocumentCode
875159
Title
Alpha Particle Induced Single Event Upsets in Bipolar Static ECL Cells
Author
Voldman, S. ; Patrick, L.
Author_Institution
IBM General Technology Division Essex Junction, Vermont 05452
Volume
31
Issue
6
fYear
1984
Firstpage
1196
Lastpage
1200
Abstract
A complete study of a bipolar static cell was done to determine alpha particle soft error sensitivities using alpha particle and circuit simulations. The results are supported by experimental data.
Keywords
Alpha particles; Circuit simulation; Doping; Error analysis; Integrated circuit technology; Logic devices; Monte Carlo methods; Semiconductor process modeling; Single event upset; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1984.4333482
Filename
4333482
Link To Document