Loss spectrum and electromagnetic behavior of problem 21 family

Author

Cheng, Zhiguang ; Takahashi, Norio ; Yang, Sumei ; Asano, Takuya ; Hu, Qifan ; Gao, Sheng ; Ren, Xiaopeng ; Yang, Hua ; Liu, Lanrong ; Gou, Luhai

Author_Institution

R&D Center, Baoding Tianwei Group Co. Ltd

Volume

42

Issue

4

fYear

2006

fDate

4/1/2006 12:00:00 AM

Firstpage

1467

Lastpage

1470

Abstract

A set of both the magnetic and electromagnetic shielding models, referred to as a new member of the Problem 21 family, is proposed to investigate the shielding effects of different kinds of shields. This paper presents the newly measured and calculated results of both the magnetic field and stray-field loss concerning the TEAM-based models to detail the electromagnetic behavior of the Problem 21 family, evaluates the engineering applicability of three-dimensional eddy current analysis methods, and validates the engineering effectiveness of the practical loss modeling proposed by the authors

Keywords

eddy currents; magnetic fields; magnetic shielding; Problem 21 family; TEAM-based models; anisotropy; eddy current analysis; electromagnetic shielding models; loss spectrum; magnetic field loss; magnetic shielding models; silicon steel lamination; stray-field loss; Current measurement; Eddy currents; Electromagnetic fields; Electromagnetic measurements; Electromagnetic modeling; Electromagnetic shielding; Loss measurement; Magnetic field measurement; Magnetic losses; Magnetic shielding; Anisotropy; Problem 21-based benchmark family; loss spectrum; silicon steel lamination;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2006.871395

Filename

1608494