Title :
Investigation of structural changes in PVDF by modified X-ray texture methods
Author :
Geiss, D. ; Hofmann, D.
Author_Institution :
Inst. of Polymer Chem., Acad. of Sci., Teltow-Seehof, East Germany
fDate :
12/1/1989 12:00:00 AM
Abstract :
Polyvinylidenefluoride films of α and αp phases have been investigated by wide-angle X-ray scattering texture analysis before and after poling in a strong electric field (E=180 MV/m). Changes in crystalline structure and orientation are discussed on the basis of these results. After uniaxial drawing and before poling the crystalline c axes are oriented along the draw direction and the dipole axes (crystalline a axes) show a slightly preferred orientation toward the transverse T direction of the sample. A partial conversion of α-phase crystallites in polar αp-phase crystallites and a preferred orientation of the polar a axes along the poling field direction N is observed after poling. Crystallites having a broad orientation spectrum between N and T are involved in the conversion. A qualitative discussion of the structural changes in the PVDF films due to poling is given
Keywords :
X-ray diffraction examination of materials; dielectric polarisation; piezoelectric materials; polymer films; polymer structure; texture; PVDF; crystal orientation; crystalline structure; dipole axes; draw direction; modified X-ray texture methods; poling; strong electric field; structural changes; transverse T direction; uniaxial drawing; wide-angle X-ray scattering texture analysis; Chemistry; Cooling; Crystalline materials; Crystallization; Ferroelectric films; Ferroelectric materials; Polarization; Polymer films; Temperature; X-ray scattering;
Journal_Title :
Electrical Insulation, IEEE Transactions on