875467

Prompt and Total Dose Response of Hard 4k and 16k CMOS Static Random Access Memories (SRAMs)

Witteles, A.A. ; Volmerange, H. ; Davidson, H. ; Yue, H. ; Jennings, R. ; Brucker, G.J.

TRW Inc. One Space Park, Redondo Beach, California 90278

31

6

1984

1354

1357

CMOS memory circuits; CMOS process; Pulse width modulation inverters; Radiation hardening; Random access memory; Resistors; Rivers; SRAM chips; Single event upset; Testing;

English

Nuclear Science, IEEE Transactions on

ieee

0018-9499

jour

10.1109/TNS.1984.4333510

4333510