Title :
Total Dose Effects in the 54HC Family of Microcircuits
Author :
Ropiak, Stan ; Sahu, Kusum ; Cleveland, Dave
Author_Institution :
Sperry Systems Management Goddard Space Flight Center Greenbelt, MD 20771 (301) 344-7696
Abstract :
Motorola and National Semiconductor 54HC00 and 54HC74 microcircuits were evaluated using CO-60 to determine their total dose radiation hardness. The devices were found to be radiation soft failing parametrically between 5 and 10 K rads and functionaly between 20 and 40 K rads. The failures were bias dependent, relatively insensitive to dose rate, and only annealed moderately when left unbiased at room temperature.
Keywords :
Annealing; Circuit testing; Clocks; Interface states; Life testing; Manufacturing; Semiconductor device testing; Space technology; Temperature dependence; Threshold voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333511
