DocumentCode
875477
Title
Total Dose Effects in the 54HC Family of Microcircuits
Author
Ropiak, Stan ; Sahu, Kusum ; Cleveland, Dave
Author_Institution
Sperry Systems Management Goddard Space Flight Center Greenbelt, MD 20771 (301) 344-7696
Volume
31
Issue
6
fYear
1984
Firstpage
1358
Lastpage
1363
Abstract
Motorola and National Semiconductor 54HC00 and 54HC74 microcircuits were evaluated using CO-60 to determine their total dose radiation hardness. The devices were found to be radiation soft failing parametrically between 5 and 10 K rads and functionaly between 20 and 40 K rads. The failures were bias dependent, relatively insensitive to dose rate, and only annealed moderately when left unbiased at room temperature.
Keywords
Annealing; Circuit testing; Clocks; Interface states; Life testing; Manufacturing; Semiconductor device testing; Space technology; Temperature dependence; Threshold voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1984.4333511
Filename
4333511
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