Title :
A simple laterally tapered waveguide for low-loss coupling to single-mode fibers
Author :
Kasaya, Kazuo ; Mitomi, Osamu ; Naganuma, Mitsuru ; Kondo, Yasuhiro ; Noguchi, Yoshio
Author_Institution :
NTT Opto-electron. Lab., Kanagawa, Japan
fDate :
3/1/1993 12:00:00 AM
Abstract :
Low-loss coupling between semiconductor photonic devices and single-mode fibers is achieved using a simple InP/InGaAsP tapered waveguide. The proposed simple structure has a small and nearly square guiding core at its output facet. In this structure, the output field has a non-Gaussian profile, but low-pass filter coupling can be achieved by optimizing the design of the guiding core sizes. The waveguide is composed of a laterally tapered InGaAsP guiding layer and an InP cladding region on an InP substrate, facilitating integration of the waveguide with active devices using conventional processes. The waveguide is shown to have a total insertion loss of 2.6 dB, including a coupling loss of 0.9 dB and large +or-2.5- mu m misalignment tolerance in lateral and vertical directions with single-mode filters.<>
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; integrated optics; optical couplers; optical losses; optical waveguides; 0.9 dB; 2.6 dB; InP cladding region; InP substrate; InP-InGaAsP; active devices; coupling loss; guiding core sizes; integrated optics; lateral directions; laterally tapered InGaAsP guiding layer; laterally tapered waveguide; low-loss coupling; low-pass filter coupling; misalignment tolerance; nearly square guiding core; nonGaussian output field; optical fibre couplers; output facet; semiconductor photonic devices; simple structure; single-mode fibers; single-mode filters; total insertion loss; vertical directions; waveguide design optimisation; Coupling circuits; Design optimization; Finite difference methods; Gaussian processes; Indium phosphide; Optical fiber devices; Optical waveguides; Refractive index; Semiconductor waveguides; Substrates;
Journal_Title :
Photonics Technology Letters, IEEE