DocumentCode
875774
Title
Relation between I/V characteristics and noise in metal-oxide-metal tunnel diodes
Author
Lecoy, G.
Volume
3
Issue
12
fYear
1967
fDate
12/1/1967 12:00:00 AM
Firstpage
566
Lastpage
567
Abstract
Current and noise measurements for metal-oxide-metal tunnel structures are given as functions of bias voltage and temperature. Experimental results are in good agreement with theoretical evaluation of shot noise associated with each individual tunnel current.
Keywords
characteristics measurement; noise; tunnel diodes;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19670445
Filename
4209964
Link To Document