Title :
The Single Event Upset (SEU) Response to 590 MeV Protons
Author :
Nichols, D.K. ; Price, W.E. ; Smith, L.S. ; Soli, G.A.
Author_Institution :
Jet Propulsion Laboratory California Institute of Technology 4800 Oak Grove Drive Pasadena, California 91109
Abstract :
A recent test of ten device types exposed to 590 MeV protons at SINR (Swiss Institute of Nuclear Research, Villigen) is presented to clarify the picture of SEU response to higher energy protons, such as those found in galactic cosmic rays, solar flares and trapped radiation belts.
Keywords :
Anisotropic magnetoresistance; Belts; Cosmic rays; Laboratories; Particle beams; Propulsion; Protons; Signal to noise ratio; Single event upset; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333550
