• DocumentCode
    875848
  • Title

    The Single Event Upset (SEU) Response to 590 MeV Protons

  • Author

    Nichols, D.K. ; Price, W.E. ; Smith, L.S. ; Soli, G.A.

  • Author_Institution
    Jet Propulsion Laboratory California Institute of Technology 4800 Oak Grove Drive Pasadena, California 91109
  • Volume
    31
  • Issue
    6
  • fYear
    1984
  • Firstpage
    1565
  • Lastpage
    1567
  • Abstract
    A recent test of ten device types exposed to 590 MeV protons at SINR (Swiss Institute of Nuclear Research, Villigen) is presented to clarify the picture of SEU response to higher energy protons, such as those found in galactic cosmic rays, solar flares and trapped radiation belts.
  • Keywords
    Anisotropic magnetoresistance; Belts; Cosmic rays; Laboratories; Particle beams; Propulsion; Protons; Signal to noise ratio; Single event upset; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1984.4333550
  • Filename
    4333550
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=875848