• DocumentCode
    875872
  • Title

    Small-size low-power bipolar memory cell

  • Author

    Wiedmann, Siegfried K. ; Berger, Horst H.

  • Volume
    6
  • Issue
    5
  • fYear
    1971
  • Firstpage
    283
  • Lastpage
    288
  • Abstract
    A d.c.-stable random-access memory (RAM) cell employing n-p-n and p-n-p transistors has been designed in a concurrent circuit-layout approach. Test chips with 2×3 arrays have been processed in a standard bipolar technology. Due to the merging of devices, the area required for a cell is only 14 mil2. The cells have been operated at an extremely low d.c. standby power of less than 0.1 μW/cell. In spite of this low standby power, an array access time of 10 ns has been measured on a simulated 512-bit array in a pulsed power mode.
  • Keywords
    Bipolar transistors; Random-access storage; Semiconductor storage devices; bipolar transistors; random-access storage; semiconductor storage devices; Circuits; Electric breakdown; Electron devices; Fabrication; Power dissipation; Pulse measurements; Silicon; Stress; Thermal degradation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1971.1050188
  • Filename
    1050188