DocumentCode :
875881
Title :
Switched collector impedance memory
Author :
Taniguchi, Kenji ; Hotta, Atsuo ; Imaizumi, Ichiro
Volume :
6
Issue :
5
fYear :
1971
fDate :
10/1/1971 12:00:00 AM
Firstpage :
289
Lastpage :
296
Abstract :
Bipolar memory cells capable of achieving as high a ratio of READ/WRITE current to standby current as 40:200 in contrast to the ratio of 0.8:8 obtainable by conventional memory cells are proposed. In a standby condition the collector impedance of the cells is high and when accessed the impedance is switched to a much lower value. The proposed device structures proficiently utilize such layers as pinched epitaxial layers or pinched base layers for the integration of high resistance or switched impedance within a minimum chip area. In breadboard tests the proposed memory cells exhibited an access time of less than 4 ns and a cycle time of less than 15 ns at standby power dissipation ranging from 50 to 200 μW/bit. A 288-bit LSI, using one of the proposed device structures, has been fabricated to obtain an access time of 4 ns and a write time of 4 ns.
Keywords :
Bipolar transistors; Large scale integration; Semiconductor storage devices; bipolar transistors; large scale integration; semiconductor storage devices; Epitaxial layers; Impedance; Large scale integration; Power dissipation; Read-write memory; Resistors; Switches; Switching circuits; Testing; Thermal resistance;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1971.1050189
Filename :
1050189
Link To Document :
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