Title :
Characterization of resistive transmission lines to 70 GHz with ultrafast optoelectronics
Author :
Deutsch, A. ; Scheuermann, M.R. ; Arjavalingam, G. ; Kneller, L. ; Tam, J.K. ; Surovic, C.W.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
The complete characterization of resistive transmission lines with the short-pulse propagation technique is extended to 70 GHz. The wide-frequency coverage is made possible by the use of ultrafast photoconductive switches for pulse generation and sampling. The picosecond optoelectronic sampling oscilloscope is described and results of measurements on thin-film strip transmission lines are presented.<>
Keywords :
microwave measurement; oscilloscopes; photoconducting devices; strip lines; 70 GHz; photoconductive switches; pulse generation; resistive transmission lines; sampling oscilloscope; short-pulse propagation technique; thin-film strip transmission lines; ultrafast optoelectronics; wide-frequency coverage; Frequency; Laser beams; Optical pulses; Oscilloscopes; Photoconductivity; Probes; Pulse generation; Sampling methods; Transmission line measurements; Transmission lines;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
