DocumentCode
875897
Title
Flash X-Ray Test of the CMOS/SOS SCP-STAR ALU
Author
Brucker, G.J. ; Oey, K.K. ; Miller, M. ; Kertesz, C.
Author_Institution
RCA Astro-Electronics P. O. Box 800 Princeton, New Jersey 08540
Volume
31
Issue
6
fYear
1984
Firstpage
1579
Lastpage
1582
Abstract
This paper reports on the measurement of the x-ray upset dose rate for a subsystem which was designed to represent the ALU part of the SCP-STAR spacecraft computer. This computer was fabricated totally with radhard, CMOS/SOS devices. The test was conducted at the OWL flash x-ray facility of Physics International. The results showed that the upset dose rate for the subsystem was 9.8×1010 and 1.7×1011 rads(Si)/s during dynamic and static modes of operation, respectively. Subsystem interactions did not compromise the upset levels of the discrete components.
Keywords
Bayesian methods; Clocks; EMP radiation effects; Equations; Extraterrestrial measurements; Protection; Sampling methods; Sequential analysis; Space vehicles; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1984.4333555
Filename
4333555
Link To Document