875954

X-band holography

Dooley, R.P.

53

11

1965

1733

1735

Charge carrier processes; Current density; Electric breakdown; Electrons; Holographic optical components; Holography; Image reconstruction; Impact ionization; Optical diffraction; Silicon;

English

Proceedings of the IEEE

ieee

0018-9219

jour

10.1109/PROC.1965.4350

1446280