DocumentCode :
876035
Title :
A precise cavity technique for measuring low resistivity semiconductors
Author :
Brodwin, M.E. ; Pao-Sun Lu
Volume :
53
Issue :
11
fYear :
1965
Firstpage :
1742
Lastpage :
1743
Keywords :
Conductivity; Copper; Electrical resistance measurement; Microwave measurements; Microwave theory and techniques; Orifices; Plugs; Resonant frequency; Semiconductivity; Semiconductor materials;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.4359
Filename :
1446289
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=876035
