DocumentCode
876035
Title
A precise cavity technique for measuring low resistivity semiconductors
Author
Brodwin, M.E. ; Pao-Sun Lu
Volume
53
Issue
11
fYear
1965
Firstpage
1742
Lastpage
1743
Keywords
Conductivity; Copper; Electrical resistance measurement; Microwave measurements; Microwave theory and techniques; Orifices; Plugs; Resonant frequency; Semiconductivity; Semiconductor materials;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1965.4359
Filename
1446289
Link To Document