Title :
Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method
Author :
Alegria, F. Corrêa ; Serra, A. Cruz
Author_Institution :
Inst. de Telecomun./Inst. Super. Tecnico, Tech. Univ. of Lisbon, Lisbon
fDate :
3/1/2009 12:00:00 AM
Abstract :
Two of the parameters that are determined when testing an analog-to-digital converter (ADC) are the gain and offset errors. One of the ways to define these two parameters is called ldquoindependently based.rdquo In this paper, we derive the precision of the gain and offset errors estimated with the histogram test method affected by additive noise.
Keywords :
AWGN; analogue-digital conversion; circuit noise; circuit testing; error analysis; ADC gain; AWGN; additive white Gaussian noise; analog-to-digital converter testing; histogram test method; independently-based gain; offset error estimation; Analog-to-digital converter (ADC); gain; histogram; offset error; precision;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2008.2005261
