DocumentCode :
876197
Title :
Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes
Author :
Han, Yinhe ; Li, Xiaowei ; Li, Huawei ; Chandra, Anshuman
Author_Institution :
Adv. Test Technol. Lab., Graduate Univ. of the Chinese Acad. of Sci., Beijing, China
Volume :
55
Issue :
2
fYear :
2006
fDate :
4/1/2006 12:00:00 AM
Firstpage :
389
Lastpage :
399
Abstract :
Test resources can be embedded on the chip to reduce required external tester channels. In order to obtain the maximal reduction of tester channels, a single-output encoder based on the check matrix of the (n, n-1, m, 3) convolutional code is presented. When the five proposed theorems are satisfied, the encoder can avoid two and any odd erroneous bit cancellations, handle one unknown bit (X-bit), and diagnose one erroneous bit. Two types of encoders are proposed to implement the check matrix of the convolutional code. A large number of X-bits can be tolerated by choosing a proper memory size and weight of the check matrix, which can also be obtained by an optimized input assignment algorithm. In order to get the full diagnostic capability, the proposed encoder can be reconfigured into a simple linear-code-based encoder by adding some additional gates. Experimental results show that the proposed encoder has an acceptable level of X-bits tolerance and a low aliasing probability.
Keywords :
convolutional codes; embedded systems; encoding; integrated circuit testing; linear codes; logic testing; system-on-chip; advanced convolutional codes; automatic test equipment; check matrix; embedded test resource; erroneous bit cancellations; error cancellation; linear code; optimized input assignment algorithm; single-output encoder; system-on-chip; tester channels; unknown bits; Acceleration; Bandwidth; Buffer storage; Circuit testing; Convolutional codes; Costs; Digital circuits; Manufacturing; System testing; Test equipment; Automatic test equipment; convolutional code; diagnosis; error cancellation; masking; unknown bits (X-bits);
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2006.870332
Filename :
1608580
Link To Document :
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