DocumentCode
876242
Title
Measurement of transfer efficiency of charge-coupled devices
Author
Berger, Josef ; Brugler, J. Stephen ; Melen, R.
Volume
6
Issue
6
fYear
1971
fDate
12/1/1971 12:00:00 AM
Firstpage
421
Lastpage
422
Abstract
A simple method for measuring the transfer efficiency of charge- coupled devices is described. It is based on the effect of charge pumping in MOS devices and has the advantages that (1) it requires a simple device and simple pulsing circuitry; and (2) the lost charge is evaluated from d.c. measurement.
Keywords
Frequency convertors; frequency convertors; Charge measurement; Charge pumps; Circuits; Current measurement; Loss measurement; MOS devices; Measurement techniques; Pulse shaping methods; Q measurement; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1971.1050220
Filename
1050220
Link To Document