DocumentCode :
876324
Title :
Conditions for optimum noise performance in l.f. amplifiers employing junction f.e.t.s
Author :
Knott, K.F.
Author_Institution :
University of Salford, Salford, UK
Volume :
4
Issue :
5
fYear :
1968
Firstpage :
92
Abstract :
Increasing the drain current of an f.e.t. can result in an improvement of the noise performance at medium frequencies, but, owing to changes in the noise spectrum of the device, a deterioration of the low-frequency noise performance can result. Measurements in the frequency range 1 Hz¿1 kHz on some low-noise samples of f.e.t.s show that the drain current is not critical up to a limit, but, above this limit, the noise performance below 10 Hz deteriorates rapidly.
Keywords :
amplifiers; transistor applications; transistor circuits;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19680072
Filename :
4210019
Link To Document :
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