Title :
Mean detector for slow fluctuations
Author_Institution :
University of Salford, Department of Electrical Engineering, Salford, UK
Abstract :
Detectors for noise measurements at low frequencies need to be capable of integrating over long periods and should also be immune from drifts of datum level. A circuit satisfying these requirements is described and its performance is quoted. The technique employs a combination of integration and a multilevel transit counting circuit.
Keywords :
noise measurement; waveform analysis;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19680076
