DocumentCode

876735

Title

Electron induced surface damage in silicon transistors

Author

Brucker, G.J. ; Dennehy, W. ; Holmes-Siedle, A.G.

Author_Institution

David Sarnoff Laboratories, Princeton, N.J.

Volume

53

Issue

11

fYear

1965

Firstpage

1800

Lastpage

1800

Keywords

Cutoff frequency; Electron beams; Electron emission; Energy measurement; Equations; Frequency measurement; Ionization; Ionizing radiation; Silicon; Voltage;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1965.4425

Filename

1446355