DocumentCode
876882
Title
Universal diagrams for TE waves guided by thin films bounded by saturable nonlinear media
Author
Torres, Juan P. ; Torner, Lluis
Author_Institution
Dept. of Signal Theory & Commun., Polytech. Univ. of Catalonia, Barcelona, Spain
Volume
29
Issue
3
fYear
1993
fDate
3/1/1993 12:00:00 AM
Firstpage
917
Lastpage
925
Abstract
It is shown that universal V -b diagrams provide a powerful tool when analyzing the stationary waveguiding properties of the TE waves guided by a thin film bounded by a saturable nonlinear substrate or cladding. For a wide class of nonlinearities, the allowed and forbidden regions of these diagrams, for a stationary guided propagation to occur, display a universal pattern, the marginal loci separating different allowed regions from the forbidden ones being simple functions of only the asymmetry measure of the waveguide and the saturation value of the nonlinear permittivity. Relevant information for device design purposes is summarized on a few diagrams, so general waveguiding properties can be immediately read-off from them, and threshold power-independent values of the normalized thickness of the waveguide for a particular kind of guided wave to be allowed are obtained. Qualitative information concerning both the guided power and the stability of guided waves is also included in the diagrams
Keywords
claddings; integrated optics; optical films; optical saturation; optical waveguide theory; permittivity; TE waves; cladding; device design; guided power; guided wave propagation; marginal loci; nonlinear permittivity; normalized thickness; planar optical waveguides; saturable nonlinear media; stationary waveguiding properties; substrate; thin films; threshold power-independent values; universal V-b diagrams; universal pattern; waveguiding properties; Absorption; Displays; Liquid crystals; Nonlinear optical devices; Nonlinear optics; Optical saturation; Optical waveguides; Substrates; Tellurium; Transistors;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.206575
Filename
206575
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