Title :
Competitive measures
Author :
White, Robert M.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
4/1/1993 12:00:00 AM
Abstract :
It is argued that technology will not advance as freely as before unless more attention is paid to metrology. The importance of measurement standards and the precarious state of research are examined. The desire of companies to realize standards in their own laboratories with accuracies approaching those of the fundamental standards is discussed. Electrical, dimensional, and time metrology are considered.<>
Keywords :
electric variables measurement; measurement standards; spatial variables measurement; time measurement; dimensional metrology; electrical metrology; measurement standards; time metrology; Assembly; Books; Failure analysis; Laser tuning; Manufacturing automation; Metrology; NIST; Remuneration; Technology management; Vehicles;
Journal_Title :
Spectrum, IEEE
