DocumentCode
877116
Title
On the Pressure Dependence of Microwave Crystal Rectifiers (Correspondence)
Author
Matthei, W.
Volume
6
Issue
1
fYear
1958
fDate
1/1/1958 12:00:00 AM
Firstpage
112
Lastpage
112
Abstract
During the past couple of years, as a result of government interest, silicon microwave crystal rectifiers have not only decreased their noise figures but also have increased their resistance to adverse environments; i.e., high burnout, high temperature, excessive humidity.
Keywords
Atmospheric measurements; Circuit noise; Frequency measurement; Impedance; Microwave measurements; Noise figure; Pressure measurement; Rectifiers; Signal to noise ratio; Silicon;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IRE Transactions on
Publisher
ieee
ISSN
0097-2002
Type
jour
DOI
10.1109/TMTT.1958.1125194
Filename
1125194
Link To Document