Title :
On the Pressure Dependence of Microwave Crystal Rectifiers (Correspondence)
fDate :
1/1/1958 12:00:00 AM
Abstract :
During the past couple of years, as a result of government interest, silicon microwave crystal rectifiers have not only decreased their noise figures but also have increased their resistance to adverse environments; i.e., high burnout, high temperature, excessive humidity.
Keywords :
Atmospheric measurements; Circuit noise; Frequency measurement; Impedance; Microwave measurements; Noise figure; Pressure measurement; Rectifiers; Signal to noise ratio; Silicon;
Journal_Title :
Microwave Theory and Techniques, IRE Transactions on
DOI :
10.1109/TMTT.1958.1125194
