• DocumentCode
    877180
  • Title

    Built-in self-test structure for mixed-mode circuits

  • Author

    Wurtz, Larry T.

  • Author_Institution
    Dept. of Electr. Eng., Alabama Univ., Tuscaloosa, AL, USA
  • Volume
    42
  • Issue
    1
  • fYear
    1993
  • fDate
    2/1/1993 12:00:00 AM
  • Firstpage
    25
  • Lastpage
    29
  • Abstract
    A built-in self-test (BIST) structure is presented which provides controllability and observability to analog circuits under test with significantly reduced hardware overhead compared to previously reported methods. The test structure is equally applicable to digital circuits, and lends itself to automated insertion into circuits under test
  • Keywords
    VLSI; built-in self test; controllability; mixed analogue-digital integrated circuits; observability; BIST; VLSI; analog circuits; automated insertion; built-in self-test; controllability; digital circuits; mixed-mode circuits; observability; test structure; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Consumer electronics; Digital circuits; Integrated circuit testing; Latches; Observability; Shift registers;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.206674
  • Filename
    206674
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=877180