DocumentCode :
877352
Title :
Characterization and measurement of the base and emitter resistances of bipolar transistors
Author :
Sansen, Willy M C ; Meyer, Robert G.
Volume :
7
Issue :
6
fYear :
1972
Firstpage :
492
Lastpage :
498
Abstract :
Most previously published methods of measuring transistor base resistance are surveyed and compared. The input impedance circle diagram method is examined in detail and correction factors due to parasitic capacitances are derived. Emitter series resistance is also estimated from this data. A new method of measuring base resistance requiring much less measurement effort is introduced and shown to give good agreement with the circle diagram method. This method is called the phase cancellation method and gives an estimate of base resistance from the common base input impedance at the collector current where its imaginary part is zero. Also an estimate of series emitter resistance is obtained from this measurement and shown to agree well with other methods.
Keywords :
Bipolar transistors; Resistance measurement; bipolar transistors; resistance measurement; Admittance measurement; Bipolar transistors; Circuits; Current measurement; Electrical resistance measurement; Frequency measurement; Impedance measurement; Laboratories; Noise measurement; Phase measurement;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1972.1050324
Filename :
1050324
Link To Document :
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