• DocumentCode
    877678
  • Title

    Negative Ion Sources Equipped with Continuous Annular and Spherical Geometry Surface Ionizers

  • Author

    Alton, G.D. ; Mills, G.D.

  • Author_Institution
    Oak Ridge National Laboratory Oak Ridge, Tennessee 37831
  • Volume
    32
  • Issue
    5
  • fYear
    1985
  • Firstpage
    1822
  • Lastpage
    1825
  • Abstract
    Axial geometry negative ion sources have been designed, developed, and evaluated for use in conjunction with tandem accelerator applications. These sources utilize continuous surface solid tungsten ionizers in either annular or spherical geometries to effect ionization of cesium vapor, which in turn is used to sputter a negatively biased probe containing the material of interest. The annular ionizer geometry source been incorporated as an "on-line" source for routine operation of the Holifield Heavy Ion Research Facility (HHIRF) tandem accelerator. Both test stand and tandem accelerator operational experience indicate that such sources are reliable, long lived, stably operating and prolific producers of a wide spectrum of negative ions. To date these sources have been used to produce more than 18 negative ion species including Ag-, Au-, B-, CaH3-, Cl-, CrH2-, Cu-, Lu-, MgH3-, Mo-, Ni-, O-, S-, Si-, Sn-, TiH3-, Tm-, and Yb-. Details of the mechanical design features and computational techniques utilized in arriving at the final electrode configuration are presented in the text. Examples of data pertinent to source operation, the dependence of negative ion yields on certain source operational parameters and of intensities typical of a particular negative ion source are also given.
  • Keywords
    Electrodes; Geometry; Ion accelerators; Ion sources; Ionization; Life estimation; Probes; Solids; Testing; Tungsten;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1985.4333736
  • Filename
    4333736