• DocumentCode
    877732
  • Title

    The close attached capacitor: a solution to switching noise problems

  • Author

    Hashemi, Seyed Hassan ; Sandborn, Peter A. ; Disko, David ; Evans, Richard

  • Author_Institution
    Microelectronics & Computer Technology Corp., Austin, TX, USA
  • Volume
    15
  • Issue
    6
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    1056
  • Lastpage
    1063
  • Abstract
    A new low-cost post-attach bypassing technique called close attached capacitor (CAC) is analyzed. It offers an attractive alternative to managing switching noise in single-chip or multichip packages. The CAC is a thin, flat capacitor, comparable in size to an IC die, that is placed on the active surface of the die and connected to on-chip power and ground pads through very short bonds. Environmental testing of the CAC process has been performed, indicating no device parameter degradation when attachment is made to the active surface of a passivated die. CAC design issues are addressed and the feasibility of manufacturing high-frequency capacitors and their assemblies using conventional reworkable or permanent attach processes is demonstrated. Examples of the integration of CACs in high-performance single-chip packages and in chips on multichip modules (MCMs) are shown, and the effectiveness of CACs in the reduction of switching noise is demonstrated
  • Keywords
    capacitors; electromagnetic compatibility; monolithic integrated circuits; multichip modules; packaging; by-pass capacitors; close attached capacitor; delta-I noise; flat capacitor; high-frequency capacitors; managing switching noise; multichip modules; multichip packages; on-chip power; passivated die; permanent attach processes; short bonds; single-chip packages; switching noise reduction; Assembly; Capacitors; Degradation; Integrated circuit noise; Manufacturing processes; Multichip modules; Packaging; Performance evaluation; Testing; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.206931
  • Filename
    206931