DocumentCode :
877808
Title :
Consequences of using the bispherical electrode system for dielectric testing
Author :
Brignell, J.E.
Author_Institution :
City University, Department of Electrical & Electronic Engineering, London, UK
Volume :
4
Issue :
21
fYear :
1968
Firstpage :
465
Lastpage :
467
Abstract :
A method is given for predicting the consequences of using a a bispherical electrode system for conduction and breakdown measurements on dielectrics. Use is made of a special function, which may be defined as the exponential of gradient averaged over a bipolar equipotential surface. As an illustration, the method is applied to measurements by House on the liquid dielectric n hexane, and it is shown that, given two points, the entire gap and stress dependence can be predicted.
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19680363
Filename :
4210179
Link To Document :
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