Title :
A Scanning Wire Beam Profile Monitor
Author :
Steinbach, Ch. ; van Rooij, M.
Author_Institution :
CERN, CH-1211 Geneva 23, Switzerland
Keywords :
Colliding beam devices; Computer displays; Light scattering; Monitoring; Particle beam measurements; Particle beams; Particle scattering; Steel; Vacuum systems; Wire;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4333767
