Title :
A New Algorithm for the Analysis of the MCUs Sensitiveness of TMR Architectures in SRAM-Based FPGAs
Author :
Sterpone, Luca ; Violante, Massimo
Author_Institution :
Politec. di Torino, Turin
Abstract :
In this paper we present an analytical analysis of the fault masking capabilities of triple modular redundancy (TMR) hardening techniques in the presence of multiple cell upsets (MCUs) in the configuration memory of SRAM-based field-programmable gate arrays (FPGAs). The analytical method we developed allows an accurate study of the MCUs provoking domain crossing errors that defeat TMR. From our analysis we have found that most of the failures affect configurable logic block´s routing resources. The experimental analysis has been performed on two realistic case study circuits. Experimental results are presented and discussed showing in particular that 2-bits MCUs may corrupt TMR 2.6 orders of magnitude more than single cell upsets (SCUs).
Keywords :
SRAM chips; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit testing; radiation hardening (electronics); redundancy; MCU sensitiveness; SRAM-based FPGA; SRAM-based field-programmable gate arrays; STAR-MCU algorithm; TMR architectures; analytical method; configurable logic blocks routing resources; configuration memory; domain crossing errors; fault masking capabilities; fault tolerance; multiple cell upsets; triple modular redundancy hardening techniques; Algorithm design and analysis; Circuit faults; Costs; Field programmable gate arrays; Integrated circuit technology; Ionizing radiation; Logic; Random access memory; Redundancy; Routing; Analytical analysis; field-programmable gate array (FPGA); multiple cell upset; triple modular redundancy (TMR);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2001858
