Title :
Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis
Author :
Berg, Melanie ; Poivey, C. ; Petrick, D. ; Espinosa, D. ; Lesea, Austin ; LaBel, K.A. ; Friendlich, M. ; Kim, H. ; Phan, Anthony
Author_Institution :
Goddard Space Flight Center, MEI Technol., NASA, Greenbelt, MD
Abstract :
A comparison of two scrubbing mitigation schemes for Xilinx field programmable gate array devices is presented. The design of the scrubbers is briefly discussed along with an examination of mitigation limitations. Heavy ion data are then presented and analyzed.
Keywords :
field programmable gate arrays; Heavy ion data; Xilinx field programmable gate array devices; external SEU scrubbing mitigation; Aerospace electronics; Availability; Costs; Field programmable gate arrays; Flip-flops; Logic devices; Programmable logic arrays; Single event upset; Space technology; Testing; Field programmable gate array (FPGA); Xilinx; reconfiguration; scrubbing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2001422
