DocumentCode
878206
Title
Accurate metallization capacitances for integrated circuits and packages
Author
Ruehli, Albert E. ; Brennan, Pierce A.
Volume
8
Issue
4
fYear
1973
Firstpage
289
Lastpage
290
Abstract
The parallel-plate formula is widely used by the solid-state circuit designer to estimate capacitances in integrated circuits. Since considerable errors may result from using this approximation, this correspondence gives correction curves for a wide range of parameters. It is shown that the finite conductor thickness may significantly contribute to the increase in capacitance.
Keywords
Capacitance; Metallisation; Monolithic integrated circuits; Packaging; capacitance; metallisation; monolithic integrated circuits; packaging; Capacitance; Conductors; Delay; Dielectric substrates; Error correction; Integrated circuit metallization; Integrated circuit packaging; Permittivity; Switching circuits; Upper bound;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1973.1050400
Filename
1050400
Link To Document