• DocumentCode
    878210
  • Title

    Input offset compensation scheme with reduced sensitivity to charge injection and leakage

  • Author

    Ramírez-Angulo, J. ; Garimella, A. ; Garimella, L.M.K. ; López-Martin, A.J. ; Carvajal, R.G.

  • Author_Institution
    Klipsch Sch. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
  • Volume
    42
  • Issue
    6
  • fYear
    2006
  • fDate
    3/16/2006 12:00:00 AM
  • Firstpage
    340
  • Lastpage
    341
  • Abstract
    A simple input offset compensation scheme, with reduced sensitivity to charge injection and leakage, is introduced. It stores an amplified version of the offset that is applied during normal operation on the input side through a capacitive divider. Offset compensation takes place in a voltage additive manner in a separate path from the input signal. Experimental results of a test chip are shown that validate the proposed scheme.
  • Keywords
    CMOS analogue integrated circuits; charge injection; operational amplifiers; CMOS technology; capacitive divider; charge injection; charge leakage; floating-gate operational amplifier; input offset compensation scheme; sensitivity;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20064320
  • Filename
    1610419