DocumentCode :
878280
Title :
A 4096-B one-transistor per bit random-access memory with internal timing and low dissipation
Author :
Boonstra, Loek ; Lambrechtse, Cees W. ; Salters, Roelof H W
Volume :
8
Issue :
5
fYear :
1973
Firstpage :
305
Lastpage :
310
Abstract :
Some details of a 4096-b p-channel random-access memory with a one-transistor per bit cell are discussed. The main features of the design are the sensitive sense-refresh amplifier, allowing a storage capacitance of only 0.065 pF, application of the bootstrap principle to obtain an access time of 400 ns, a power dissipation of 150 mW, and the implementation of a new, fast shift register as an internal timing circuit. This timing circuit generates the memory clock signals, reducing the number of external clock signals to one clock and a chip select signal. The chip size is 3.01/spl times/4.44 mm/SUP 2/.
Keywords :
Digital integrated circuits; Random-access storage; Semiconductor storage systems; Shift registers; digital integrated circuits; random-access storage; semiconductor storage systems; shift registers; Aluminum; Circuit noise; Clocks; Parasitic capacitance; Plasma measurements; Pulse measurements; Random access memory; Read-write memory; Semiconductor device noise; Timing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1973.1050408
Filename :
1050408
Link To Document :
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