Title :
High-efficiency native-oxide-passivated high-index-contrast ridge waveguide lasers
Author :
Liang, D. ; Wang, J. ; Hall, D.C.
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, IN, USA
fDate :
3/16/2006 12:00:00 AM
Abstract :
A GaAs-based high-index-contrast ridge waveguide laser is fabricated using a self-aligned process of deep dry etching plus oxygen-enhanced wet thermal oxidation of low Al-content AlGaAs. Lasers operating at λ=813 nm (CW, 300 K) with external differential quantum efficiencies as high as 78% are demonstrated, indicating effective passivation of the directly-oxidised etched active region sidewall surface.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; oxidation; passivation; ridge waveguides; waveguide lasers; AlGaAs; GaAs; deep dry etching; high-efficiency native-oxide-passivation; high-index-contrast ridge waveguide laser; oxygen-enhanced wet thermal oxidation; quantum efficiency; self-aligned process;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20064090